Concepedia

Author

Victor Liang

United Microelectronics (Taiwan)

Also Known As

Liang, Victor, Liang, Victor C., V. Liang, Victor C. Liang, Victor Liang

49

Publications

427

Citations

12

H-Index

41

Concepts

All Affiliations

United Microelectronics (Taiwan)National Yang Ming Chiao Tung UniversityNational Institutes of Applied ResearchUnited Microelectronics (United States)Institute of Nuclear Energy Research
VL

About

Victor Liang is an author at United Microelectronics (Taiwan) specializing in microelectronics, engineering, and electrical engineering.

Top Concepts

#ConceptH-IndexPublicationsCitations

1

Engineering

11

13

332

2

Applied Physics

9

9

158

3

Computer Engineering

3

3

58

4

Business

1

1

35

5

Computer Science

1

1

35

Victor Liang

×

15

Publications

356

Citations

12

H-Index

YearCitations

K-band low-noise amplifiers using 0.18 /spl mu/m CMOS technology

Kyung-Wan Yu, Yin-Lung Lu, Da‐Chiang Chang,

IEEE Microwave and Wireless Components Letters

2004

91

RF passive devices on Si with excellent performance close to ideal devices designed by electro-magnetic simulation

Albert Chin, K.T. Chan, Chao-Jen Huang,

2004

37

Mercury: Metro density prediction with recurrent neural network on streaming CDR data

Victor Liang, T. B. Richard, Wee Siong Ng,

2016

35

psub guard ring design and modeling for the purpose of substrate noise isolation in the SOC era

Tsun-Lai Hsu, Yu‐Chia Chen, Hua‐Chou Tseng,

IEEE Electron Device Letters

2005

29

Trench Etches in Silicon with Controllable Sidewall Angles

Robert N. Carlile, Victor Liang, O.A. Palusinski,

Journal of The Electrochemical Society

1988

21

A new failure mechanism by corrosion of tungsten in a tungsten plug process

Shilpa Bothra, H. Sur, Victor Liang

Microelectronics Reliability

1999

19

The minimum noise figure and mechanism as scaling RF MOSFETs from 0.18 to 0.13 μm technology nodes

Chuncheng Huang, K.T. Chan, C.Y. Chen,

2003

19

Low RF loss and noise of transmission lines on Si substrates using an improved ion implantation process

K.T. Chan, Albert Chin, S. P. McAlister,

2003

17

On the RF Extrinsic Resistance Extraction for Partially-Depleted SOI MOSFETs

Shengchun Wang, Pin Su, Kun‐Ming Chen,

IEEE Microwave and Wireless Components Letters

2007

16

Hot-carrier induced degradations on RF power characteristics of SiGe heterojunction bipolar transistors

Sheng-Yi Huang, Kun‐Ming Chen, Guo-Wei Huang,

IEEE Transactions on Device and Materials Reliability

2005

14

Page 1