Huaisheng Wang

A Unified Degradation Model of a-InGaZnO TFTs Under Negative Gate Bias With or Without an Illumination

Shuai Li, Mingxiang Wang, Dongli Zhang et al. · IEEE Journal of the Electron Devices Society · 2019 · 37 citations · Full text

Engineering, Semiconductor Device, Semiconductors +21

Stress Power Dependent Self-Heating Degradation of Metal-Induced Laterally Crystallized n-Type Polycrystalline Silicon Thin-Film Transistors

Huaisheng Wang, Mingxiang Wang, Zhenyu Yang et al. · IEEE Transactions on Electron Devices · 2007 · 31 citations

Materials Science, Semiconductors, Electrical Engineering +11

Federated-LSTM based Network Intrusion Detection Method for Intelligent Connected Vehicles

Tianqi Yu, Hua Guo-dong, Huaisheng Wang et al. · ICC 2022 - IEEE International Conference on Communications · 2022 · 29 citations

Hardware Security, Vehicle Communication, Internet Of Vehicle +15

Degradation of Metal-Induced Laterally Crystallized n-Type Polycrystalline Silicon Thin-Film Transistors Under Synchronized Voltage Stress

Meng Zhang, Mingxiang Wang, Huaisheng Wang et al. · IEEE Transactions on Electron Devices · 2009 · 27 citations

Electrical Engineering, Engineering, Crystalline Defects +13

Dynamic degradation of a-InGaZnO thin-film transistors under pulsed gate voltage stress

Huaisheng Wang, Mingxiang Wang, Qi Shan · Applied Physics Letters · 2015 · 26 citations

Electrical Engineering, Dynamic Degradation, Engineering +13