Kenichi Kosaka

Effects of Traps Formed by Threading Dislocations on Off-State Breakdown Characteristics in GaN Buffer Layer in AlGaN/GaN Heterostructure Field-Effect Transistors

Akihiro Hinoki, Junjiroh Kikawa, Tomoyuki Yamada et al. · Applied Physics Express · 2007 · 46 citations

Engineering, Electrical Engineering, Materials Science +17

Analyses of High Leakage Currents in Al<sup>+</sup> Implanted 4H SiC pn Diodes Caused by Threading Screw Dislocations

Takashi Tsuji, Takehiko Tawara, Ryohei Tanuma et al. · Materials science forum · 2010 · 31 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Measurement of temperature-dependent stress in copper-filled silicon vias using polarized Raman spectroscopy

Ryuichi Sugie, Kenichi Kosaka, Hirofumi Seki et al. · Journal of Applied Physics · 2013 · 24 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17

Stress Characterization of 4H-SiC Metal–Oxide–Semiconductor Field-Effect Transistor (MOSFET) using Raman Spectroscopy and the Finite Element Method

Masanobu Yoshikawa, Kenichi Kosaka, Hirohumi Seki et al. · Applied Spectroscopy · 2016 · 20 citations

Engineering, Electrical Engineering, Physics +17

Characterization of process-induced defects in SiC MOSFETs by cross-sectional cathodoluminescence

Ryuichi Sugie, Tomoyuki Uchida, Kenichi Kosaka et al. · Japanese Journal of Applied Physics · 2016 · 17 citations

Engineering, Electrical Engineering, Materials Science +17