Nigel D. Young

A Comparison of the Performance and Stability of ZnO-TFTs With Silicon Dioxide and Nitride as Gate Insulators

Richard Cross, M.M. De Souza, S. C. Deane et al. · IEEE Transactions on Electron Devices · 2008 · 98 citations

Engineering, Gate Bias Stress, Zinc Oxide +17

Intrinsic Gain in Self-Aligned Polysilicon Source-Gated Transistors

Radu A. Sporea, M. J. Trainor, Nigel D. Young et al. · IEEE Transactions on Electron Devices · 2010 · 70 citations

Device Modeling, Electrical Engineering, Engineering +10

A study of hydrogen peroxide chemistry and photochemistry in tea stain solution with relevance to clinical tooth whitening

Nigel D. Young, Peter Fairley, Veena Mohan et al. · Journal of Dentistry · 2012 · 65 citations

Hydrogen Peroxide Chemistry, Photochemistry, Operative Dentistry +4

Field Plate Optimization in Low-Power High-Gain Source-Gated Transistors

Radu A. Sporea, M. J. Trainor, Nigel D. Young et al. · IEEE Transactions on Electron Devices · 2012 · 46 citations

Engineering, Field Plate Optimization, Integrated Circuits +16

Low Temperature Poly-Si on Flexible Polymer Substrates for Active Matrix Displays and Other Applications

Nigel D. Young, M. J. Trainor, Soo‐Young Yoon et al. · MRS Proceedings · 2003 · 32 citations

Materials Science, Engineering, Semiconducting Polymer +13