Robert E. Gleason - Concepedia

Author

Robert E. Gleason

Rice University

Also Known As

R. E. Gleason, R.E. Gleason, Robert E. Gleason, Robert Gleason

Publications

419

Citations

H-Index

Concepts

All Affiliations

Rice University University of Wisconsin–Madison

About

Robert E. Gleason is an author at Rice University specializing in applied physics, engineering, and atomic physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	5	5	368
2	Applied Physics	5	5	368
3	Natural Sciences	4	4	355
4	Physics	4	4	355
5	Materials Science	1	1	13

Robert E. Gleason

Publications

379

Citations

H-Index

Page 1

	Year	Citations
Production Mechanisms and Radiative Lifetimes of Argon and Xenon Molecules Emitting in the Ultraviolet J. W. Keto, Robert E. Gleason, G. K. Walters Physical Review Letters Ultraviolet LightX-ray SpectroscopyEngineeringRadiating MoleculesRadiative Transfer	1974	191
Collisional mixing of the lowest bound molecular states in xenon and argon J. W. Keto, Robert E. Gleason, T. Bonifield, Chemical Physics Letters EngineeringPhysicsNatural SciencesApplied PhysicsUltracold Atom	1976	101
Electronic energy transfer in argon–xenon mixtures excited by electron bombardment Robert E. Gleason, T. Bonifield, J. W. Keto, The Journal of Chemical Physics Argon ContinuumX-ray SpectroscopyXenon AtomsPhysicsEngineering	1977	45
Exciton lifetimes in electron beam excited condensed phases of argon and xenon J. W. Keto, Robert E. Gleason, F. K. Soley The Journal of Chemical Physics Electronic Excited StateExcited State PropertyLocalized Excited StateEngineeringPhysics	1979	18
Lithography strategy for 65-nm node Yan Borodovsky, Richard E. Schenker, Gary Allen, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Materials ScienceEngineeringBeam LithographyElectron-beam LithographyMicrofabrication	2002	13
<title>Contributions of stepper lenses to systematic CD errors within exposure fields</title> Huayu Liu, Crid Yu, Robert E. Gleason Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Electrical ResistanceField CoordinatesOphthalmologyCalibrationSystematic Cd Errors	1995	11

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