Mong-Song Liang

Electron trapping in very thin thermal silicon dioxides

Mong-Song Liang, Chenming Hu · 1981 · 77 citations

Engineering, Electrical Engineering, Materials Science +17

Spatial and energetic distribution of border traps in the dual-layer HfO2∕SiO2 high-k gate stack by low-frequency capacitance-voltage measurement

Wei-Hao Wu, Bing‐Yue Tsui, Mao-Chieh Chen et al. · Applied Physics Letters · 2006 · 20 citations

Engineering, Electrical Engineering, Materials Science +17

Low power device technology with SiGe channel, HfSiON, and Poly-Si gate

H.C.-H. Wang, Shang-Jr Chen, Ming-Fang Wang et al. · 2005 · 19 citations

Engineering, Electrical Engineering, Materials Science +17

Dielectric and Barrier Properties of Spin-On Organic Aromatic Low Dielectric Constant Polymers FLARE and SiLK

Zhen-Cheng Wu, Zhi-Wen Shiung, Ren‐Guay Wu et al. · Journal of The Electrochemical Society · 2001 · 12 citations

Natural Sciences, Materials Engineering, Materials Science +17