Gerard Ghibaudo

Direct evaluation of low-field mobility and access resistance in pentacene field-effect transistors

Yong Xu, Takeo Minari, Kazuhito Tsukagoshi et al. · Journal of Applied Physics · 2010 · 213 citations

Engineering, Electrical Engineering, Materials Science +13

Comparison for 1/ ${f}$ Noise Characteristics of AlGaN/GaN FinFET and Planar MISHFET

Sindhuri Vodapally, Christoforos Theodorou, Young-Ho Bae et al. · IEEE Transactions on Electron Devices · 2017 · 40 citations

Engineering, Electrical Engineering, Electronic Materials +16

Analytical Drain Current Compact Model in the Depletion Operation Region of Short-Channel Triple-Gate Junctionless Transistors

Theodoros A. Oproglidis, A. Tsormpatzoglou, D.H. Tassis et al. · IEEE Transactions on Electron Devices · 2016 · 34 citations

Engineering, Electrical Engineering, Electronic Materials +16

Drain-Current Flicker Noise Modeling in nMOSFETs From a 14-nm FDSOI Technology

E.G. Ioannidis, Christoforos Theodorou, T.A. Karatsori et al. · IEEE Transactions on Electron Devices · 2015 · 27 citations

Engineering, Electrical Engineering, Microelectronics +16

Analytical Modeling of Threshold Voltage and Interface Ideality Factor of Nanoscale Ultrathin Body and Buried Oxide SOI MOSFETs With Back Gate Control

N. Fasarakis, T.A. Karatsori, D.H. Tassis et al. · IEEE Transactions on Electron Devices · 2014 · 24 citations

Engineering, Electrical Engineering, Materials Science +17