D. Mangelinck

Impact of directional walk on atom probe microanalysis

Baptiste Gault, F. Danoix, K. Hoummada et al. · Ultramicroscopy · 2011 · 153 citations · Full text

Engineering, Physics, Microscopy +8

A comparative study of nickel silicides and nickel germanides: Phase formation and kinetics

F. Nemouchi, D. Mangelinck, János L. Lábár et al. · Microelectronic Engineering · 2006 · 48 citations

Materials Science, Inorganic Chemistry, Engineering +12

Atom probe tomography of secondary γ′ precipitation in a single crystal Ni-based superalloy after isothermal aging at 1100°C

Xipeng Tan, D. Mangelinck, Carine Perrin-Pellegrino et al. · Journal of Alloys and Compounds · 2014 · 41 citations · Full text

Materials Science, Engineering, Superalloy +7

Three dimensional distributions of arsenic and platinum within NiSi contact and gate of an n-type transistor

Federico Panciera, K. Hoummada, M. Grégoire et al. · Applied Physics Letters · 2011 · 34 citations

Selective Etching, Engineering, Nisi Contact +20

First silicide formed by reaction of Ni(13%Pt) films with Si(100): Nature and kinetics by in-situ X-ray reflectivity and diffraction

Magali Putero, Loeizig Ehouarne, Eric Ziegler et al. · Scripta Materialia · 2010 · 32 citations

Materials Science, Engineering, Surface Science +8