K. Hoummada - Concepedia

Author

K. Hoummada

Centre National de la Recherche Scientifique ORCID

Also Known As

HOUMMADA, Khalid, Hoummada, K., Hoummada, Khalid, K HOUMMADA, K Hoummada, K. Hoummada, Khadija Hoummada, Khalid Hoummada

174

Publications

1.9K

Citations

H-Index

Concepts

All Affiliations

Centre National de la Recherche Scientifique Institut des Matériaux, de Microélectronique et des Nanosciences de Provence Aix-Marseille Université STMicroelectronics (France)CEA Grenoble

About

K. Hoummada is an author at Centre National de la Recherche Scientifique specializing in engineering, materials science, and applied physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	20	49	1.3K
2	Applied Physics	18	37	1.1K
3	Chemistry	12	13	303
4	Natural Sciences	4	4	116
5	Chemical Engineering	3	3	73

K. Hoummada

Publications

1.6K

Citations

H-Index

Page 1

	Year	Citations
Impact of directional walk on atom probe microanalysis Baptiste Gault, F. Danoix, K. Hoummada, Ultramicroscopy EngineeringPhysicsMicroscopyScanning Probe MicroscopyApplied Physics	2011	153
Grain-boundary segregation of boron in high-strength steel studied by nano-SIMS and atom probe tomography G. Da Rosa, Philippe Maugis, A. Portavoce, Acta Materialia Materials ScienceBoron NitrideEngineeringGrain-boundary SegregationHigh-strength Steel	2019	94
Three-dimensional composition mapping of NiSi phase distribution and Pt diffusion via grain boundaries in Ni2Si D. Mangelinck, K. Hoummada, A. Portavoce, Scripta Materialia Materials ScienceEngineeringNisi Phase DistributionPhysicsPhase Equilibrium	2010	56
Snowplow effect and reactive diffusion in the Pt doped Ni–Si system Oana Cojocaru‐Mirédin, D. Mangelinck, K. Hoummada, Scripta Materialia Materials ScienceSemiconductor TechnologyReactive DiffusionNi–si SystemEngineering	2007	55
Effect of Pt addition on Ni silicide formation at low temperature: Growth, redistribution, and solubility K. Hoummada, Carine Perrin-Pellegrino, D. Mangelinck Journal of Applied Physics EngineeringSitu X-ray DiffractionSolid-state ChemistryChemistryLow Temperature	2009	53
A methodology for the measurement of the interfacial excess of solute at a grain boundary Philippe Maugis, K. Hoummada Scripta Materialia Interfacial ProcessEngineeringInterfacial ExcessInterfacial PhenomenonGrain Boundary	2016	45
Composition measurement of the Ni-silicide transient phase by atom probe tomography K. Hoummada, Ivan Blum, D. Mangelinck, Applied Physics Letters EngineeringAtomic Emission SpectroscopyMicroscopySitu X-ray DiffractionAtom Probe Tomography	2010	44
First stages of the formation of Ni silicide by atom probe tomography K. Hoummada, E. Cadel, D. Mangelinck, Applied Physics Letters EngineeringMicroscopyGrowth ModelAtom Probe TomographyChemistry	2006	43
Nickel segregation on dislocation loops in implanted silicon K. Hoummada, D. Mangelinck, Baptiste Gault, Scripta Materialia Materials ScienceEngineeringDislocation InteractionNickel SegregationApplied Physics	2010	41
Structural, dielectric, and ferroelectric properties of lead-free BCZT ceramics elaborated by low-temperature hydrothermal processing Zouhair Hanani, D. Mezzane, M. Amjoud, Journal of Materials Science Materials in Electronics Materials ScienceElectrical EngineeringEngineeringFunctional CeramicLow-temperature Hydrothermal Processing	2020	41

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