Jia-Hong Lin

A fault classification method by RBF neural network with OLS learning procedure

Whei-Min Lin, Chin-Der Yang, Jia-Hong Lin et al. · IEEE Transactions on Power Delivery · 2001 · 107 citations

Computing, Computer Science, Electrical Engineering +17

Comparison of the Hot Carrier Degradation of N- and P-Type Fin Field-Effect Transistors in 14-nm Technology Nodes

Fong‐Min Ciou, Jia-Hong Lin, Po‐Hsun Chen et al. · IEEE Electron Device Letters · 2021 · 16 citations

Engineering, Electrical Engineering, Microelectronics +15

Investigation of Threshold Voltage and Drain Current Degradations in Si₃N₄/AlGaN/GaN MIS-HEMTs Under X-Ray Irradiation

Hung-Ming Kuo, Ting‐Chang Chang, Kai‐Chun Chang et al. · IEEE Transactions on Electron Devices · 2023 · 12 citations

Engineering, Electrical Engineering, Materials Engineering +17

Abnormal on Current Tendency in Saturation Region Between High and Light Carbon Doped Buffer Layer in p-GaN HEMT

Chien-Hung Yeh, Po‐Hsun Chen, Ting‐Chang Chang et al. · IEEE Electron Device Letters · 2023 · 10 citations

Engineering, Electrical Engineering, Materials Science +17