Ren Huang

Importance of $\Delta V_{{\text {DIBLSS}}}/({I}_{{\text {on}}} /{I}_{{\text {off}}})$ in Evaluating the Performance of n-Channel Bulk FinFET Devices

Yi-Chuen Eng, Chih-Chiang Tseng, Ren Huang et al. · IEEE Journal of the Electron Devices Society · 2018 · 31 citations · Full text

Engineering, Electrical Engineering, Electronic Materials +6

Understanding charge traps for optimizing Si-passivated Ge nMOSFETs

Pengpeng Ren, Rui Gao, Zhigang Ji et al. · 2016 · 19 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Investigation of normally-off GaN-based p-channel and n-channel heterojunction field-effect transistors for monolithic integration

Weihang Zhang, Xi Liu, Liyu Fu et al. · Results in Physics · 2021 · 19 citations · Full text

Engineering, Electrical Engineering, Materials Science +17