T. Gustafsson - Concepedia

Author

T. Gustafsson

Rutgers, The State University of New Jersey

Also Known As

Gustafsson, T., T Gustafsson, T O Gustafsson, T. GUSTAFSSON, T. Gustafsson, T. O. Gustafsson

203

Publications

7.9K

Citations

H-Index

121

Concepts

All Affiliations

Rutgers, The State University of New Jersey University of Pennsylvania

About

T. Gustafsson is an author at Rutgers, The State University of New Jersey specializing in engineering, applied physics, and surface science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	44	91	5.1K
2	Applied Physics	41	82	4.6K
3	Natural Sciences	26	40	2.1K
4	Medicine	4	4	206
5	Health Sciences	2	2	43

T. Gustafsson

114

Publications

Citations

H-Index

Page 1

	Year	Citations
The orientation of CO adsorbed on Ni(100) C.L. Allyn, T. Gustafsson, E. W. Plummer Chemical Physics Letters Surface AnalysisSurface SciencePhysics	1977	294
Intermixing at the tantalum oxide/silicon interface in gate dielectric structures G. B. Alers, D. J. Werder, Yves J. Chabal, Applied Physics Letters Oxide HeterostructuresMaterials ScienceElectrical EngineeringDielectric ConstantEngineering	1998	264
Gold nanostar substrates for SERS-based chemical sensing in the femtomolar regime Agampodi S. De Silva Indrasekara, Sarah Meyers, S. M. Shubeita, Nanoscale	2014	258
Growth mechanism of thin silicon oxide films on Si(100) studied by medium-energy ion scattering E. P. Gusev, Hongcheng Lu, T. Gustafsson, Physical review. B, Condensed matter	1995	217
High temperature stability in lanthanum and zirconia-based gate dielectrics Jon‐Paul Maria, Dwi Wicaksana, Angus I. Kingon, Journal of Applied Physics Materials ScienceGate DielectricsElectrical EngineeringHigh Temperature StabilityEngineering	2001	190
Growth and characterization of ultrathin nitrided silicon oxide films E. P. Gusev, Hongcheng Lu, Eric Garfunkel, IBM Journal of Research and Development EngineeringGate Dielectric ApplicationsThin Film Process TechnologySilicon On InsulatorSemiconductor Nanostructures	1999	188
Structure of Au(110) Determined with Medium-Energy-Ion scattering M. Copel, T. Gustafsson Physical Review Letters EngineeringAtomic Emission SpectroscopyMicroscopyElectron DiffractionSpectroscopic Property	1986	177
Experimental and theoretical study of the surface resonances on the (100) faces of W and Mo Shang-Lin Weng, E. W. Plummer, T. Gustafsson Physical review. B, Condensed matter EngineeringTheoretical StudyElectron SpectroscopyQuantum MaterialsElectric Field	1978	163
Full depth profile of passive films on 316L stainless steel based on high resolution HAXPES in combination with ARXPS Wendy Fredriksson, Sara Malmgren, T. Gustafsson, Applied Surface Science Materials ScienceMaterials EngineeringEngineeringStainless SteelCorrosion	2012	157
Interpretation of the photoelectron spectra of molecularly adsorbed CO T. Gustafsson, E. W. Plummer, D. E. East̀man, Solid State Communications Molecular SpectroscopyPhotochemistryNatural SciencesSpectroscopyPhysical Chemistry	1975	157

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