W. E. Ham

The Si/SiO2 interface examined by cross-sectional transmission electron microscopy

Juliette Blanc, C. J. Buiocchi, M. S. Abrahams et al. · Applied Physics Letters · 1977 · 56 citations

Engineering, Materials Science, Physics +17

Direct Observation of the Structure of Thin, Commercially Useful Silicon on Sapphire Films by Cross Section Transmission Electron Microscopy

W. E. Ham, M. S. Abrahams, C. J. Buiocchi et al. · Journal of The Electrochemical Society · 1977 · 27 citations

Engineering, Materials Engineering, Materials Science +17

Surface charge effects on the resistivity and Hall coefficient of thin silicon-on-sapphire films

W. E. Ham · Applied Physics Letters · 1972 · 24 citations

Natural Sciences, Electrical Engineering, Materials Science +17

The characterization of heteroepitaxial silicon

G. W. Cullen, M. S. Abrahams, J. F. Corboy et al. · Journal of Crystal Growth · 1982 · 22 citations

Engineering, Materials Engineering, Materials Science +12