Cheng-Hao Hou

High Uniformity of Resistive Switching Characteristics in a Cr/ZnO/Pt Device

Wen-Yuan Chang, Hsin-Wei Huang, Wei‐Ting Wang et al. · Journal of The Electrochemical Society · 2012 · 52 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +15

Bandgap engineering of tunnel oxide with multistacked layers of Al2O3/HfO2/SiO2 for Au-nanocrystal memory application

Yun-Shan Lo, Ke‐Chih Liu, Jyun-Yi Wu et al. · Applied Physics Letters · 2008 · 38 citations

Natural Sciences, Materials Engineering, Materials Science +16

Effects of Surface Treatments on Interfacial Self-Cleaning in Atomic Layer Deposition of Al[sub 2]O[sub 3] on InSb

Cheng-Hao Hou, M. C. Chen, Chih‐Ju Chang et al. · Journal of The Electrochemical Society · 2008 · 36 citations

Engineering, Materials Engineering, Materials Science +17

A novel multi deposition multi room-temperature annealing technique via Ultraviolet-Ozone to improve high-K/metal (HfZrO/TiN) gate stack integrity for a gate-last process

Lei Wu, K. S. Yew, D. S. Ang et al. · 2010 · 14 citations

Engineering, Electrical Engineering, Materials Engineering +17

Interfacial Cleaning Effects in Passivating InSb with Al[sub 2]O[sub 3] by Atomic Layer Deposition

Cheng-Hao Hou, M. C. Chen, Chih‐Ju Chang et al. · Electrochemical and Solid-State Letters · 2008 · 13 citations

Natural Sciences, Materials Engineering, Materials Science +17