Setsuo Iwata

BRIDGE DEFLECTION MEASUREMENT USING DIGITAL IMAGE CORRELATION

Satoru Yoneyama, Akikazu Kitagawa, Setsuo Iwata et al. · Experimental Techniques · 2007 · 222 citations

Bridge Design, Engineering, Machine Vision +6

A new tungsten gate process for VLSI applications

Setsuo Iwata, Naoki Yamamoto, N. Kobayashi et al. · IEEE Transactions on Electron Devices · 1984 · 61 citations

Semiconductors, Materials Science, Electrical Engineering +14

Fabrication of Highly Reliable Tungsten Gate MOS VLSI's

Naoki Yamamoto, Haruki Kume, Setsuo Iwata et al. · Journal of The Electrochemical Society · 1986 · 28 citations

Materials Science, Materials Engineering, Electrical Engineering +14

The influence of internal stresses in tungsten-gate electrodes on the degradation of MOSFET characteristics caused by hot carriers

Naoki Yamamoto, Setsuo Iwata, Haruki Kume · IEEE Transactions on Electron Devices · 1987 · 22 citations

Engineering, Integrated Circuits, Semiconductor Device +18

RFCPUs on glass and plastic substrates fabricated by TFT transfer technology

Hiroki Dembo, Yasuyoshi Kurokawa, T. Ikeda et al. · 2006 · 19 citations

Engineering, Radio Frequency, Optical Glass +21