Statistics
Publications
4
Citations
180
H-Index
4
Active since
2006
Affiliations
Carl Zeiss (United States)(Current)
L. Farkas is an author at Carl Zeiss (United States) specializing in natural sciences, materials science, and surface science.
Publications per year
2006–2010
4
4
An Introduction to the Helium Ion Microscope
John Notte, Bill Ward, Nick Economou et al. · AIP conference proceedings · 2007 · 78 citations
Beam induced deposition of platinum using a helium ion microscope
Colin A. Sanford, Lewis Stern, Louise Barriss et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2009 · 47 citations · Full text
Natural Sciences, Materials Engineering, Materials Science +11
An Introduction to Helium Ion Microscopy
John Notte, R. Hill, Shawn McVey et al. · Microscopy and Microanalysis · 2006 · 34 citations
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