Emmanuel Hernandez - Concepedia

Author

Emmanuel Hernandez

Laboratoire Procédés, Matériaux et Energie Solaire

Also Known As

E. Hernandez, E. N. Hernandez, E. Norman Hernandez, Emmanuel Hernandez, Hernandez, E., Hernandez, Emmanuel, Hody, H.

Publications

203

Citations

H-Index

Concepts

All Affiliations

Laboratoire Procédés, Matériaux et Energie Solaire Centre National de la Recherche Scientifique Université de Perpignan Air Liquide (France)

About

Emmanuel Hernandez is an author at Laboratoire Procédés, Matériaux et Energie Solaire specializing in engineering, photovoltaics, and applied physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	5	5	168
2	Applied Physics	3	3	87
3	Electrical Engineering	3	3	87
4	Education	2	2	81
5	Chemical Engineering	1	1	18

Emmanuel Hernandez

Publications

180

Citations

H-Index

Page 1

	Year	Citations
Two-Laser Optical Distance-Measuring Instrument that Corrects for the Atmospheric Index of Refraction K. B. Earnshaw, Emmanuel Hernandez Applied Optics Environmental MonitoringNew InstrumentWave Propagation LaboratoryMeasurementOptical Properties	1972	67
Efficient silicon nitride SiN<sub>x</sub>:H antireflective and passivation layers deposited by atmospheric pressure PECVD for silicon solar cells J.‐F. Lelièvre, Bishal Kafle, Pierre Saint‐Cast, Progress in Photovoltaics Research and Applications Enhanced Sin XOptical MaterialsEngineeringOptoelectronic DevicesEfficient Silicon	2019	40
Silicon carbon nitride films as passivation and antireflective coatings for silicon solar cells José A. Silva, Sébastien Quoizola, Emmanuel Hernandez, Surface and Coatings Technology Electrical EngineeringEngineeringSilicon On InsulatorApplied PhysicsSilicon Carbon	2014	29
a-SiNx:H Antireflective And Passivation Layer Deposited By Atmospheric Pressure Plasma Julien Vallade, S. Pouliquen, P. Lecouvreur, Energy Procedia Cold Atmospheric PlasmaChemical EngineeringElectrical EngineeringEngineeringNonthermal Plasma	2012	18
Field tests of a two-laser (4416 A and 6328 A) optical distance-measuring instrument correcting for the atmospheric index of refraction Emmanuel Hernandez, K. B. Earnshaw Journal of Geophysical Research Atmospheres Field TestsEngineeringMeasurementOptical TestingInterferometry	1972	14
SiCN:H thin films deposited by MW‐PECVD with liquid organosilicon precursor: Gas ratio influence versus properties of the deposits Béatrice Plujat, Hervé Glénat, A. Bousquet, Plasma Processes and Polymers	2019	12

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