Emmanuel Hernandez

Two-Laser Optical Distance-Measuring Instrument that Corrects for the Atmospheric Index of Refraction

K. B. Earnshaw, Emmanuel Hernandez · Applied Optics · 1972 · 67 citations

Environmental Monitoring, New Instrument, Wave Propagation Laboratory +15

Efficient silicon nitride SiN_x:H antireflective and passivation layers deposited by atmospheric pressure PECVD for silicon solar cells

J.‐F. Lelièvre, Bishal Kafle, Pierre Saint‐Cast et al. · Progress in Photovoltaics Research and Applications · 2019 · 40 citations · Full text

Enhanced Sin X, Optical Materials, Engineering +18

Silicon carbon nitride films as passivation and antireflective coatings for silicon solar cells

José A. Silva, Sébastien Quoizola, Emmanuel Hernandez et al. · Surface and Coatings Technology · 2014 · 29 citations

Electrical Engineering, Engineering, Silicon On Insulator +8

a-SiNx:H Antireflective And Passivation Layer Deposited By Atmospheric Pressure Plasma

Julien Vallade, S. Pouliquen, P. Lecouvreur et al. · Energy Procedia · 2012 · 18 citations · Full text

Cold Atmospheric Plasma, Chemical Engineering, Electrical Engineering +15

Field tests of a two-laser (4416 A and 6328 A) optical distance-measuring instrument correcting for the atmospheric index of refraction

Emmanuel Hernandez, K. B. Earnshaw · Journal of Geophysical Research Atmospheres · 1972 · 14 citations

Field Tests, Engineering, Measurement +24