Yo-Hwan Koh - Concepedia

Author

Yo-Hwan Koh

SK Group (United States)

Also Known As

Yo-Hwan Koh, Yohwan Koh

Publications

325

Citations

H-Index

Concepts

All Affiliations

SK Group (United States)

About

Yo-Hwan Koh is an author at SK Group (United States) specializing in engineering, electrical engineering, and microelectronics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	11	11	287
2	Electrical Engineering	10	10	263
3	Computer Engineering	8	8	226
4	Applied Physics	6	6	146
5	Computer Science	1	1	24

Yo-Hwan Koh

Publications

297

Citations

H-Index

Page 1

	Year	Citations
NAND Flash Scaling Beyond 20nm Yo-Hwan Koh Non-volatile MemoryElectrical EngineeringNm Technology NodeEngineeringPhysics	2009	54
A 32-Gb MLC NAND Flash Memory With Vth Endurance Enhancing Schemes in 32 nm CMOS Changhyuk Lee, Sok-Kyu Lee, Sunghoon Ahn, IEEE Journal of Solid-State Circuits Novel ProgramNon-volatile MemoryElectrical EngineeringMemory ArchitectureEngineering	2010	44
A low power and highly reliable 400Mbps mobile DDR SDRAM with on-chip distributed ECC Saeng-Hwan Kim, Wonoh Lee, Jung Ho Kim, Non-volatile MemoryReliable 400MbpsVlsi DesignEngineeringMb Mobile Sdram	2007	44
Body-contacted SOI MOSFET structure with fully bulk CMOS compatible layout and process Yo-Hwan Koh, Jin-Hyeok Choi, Myung-Hee Nam, IEEE Electron Device Letters Electrical EngineeringPhysical Design (Electronics)EngineeringVlsi DesignAdvanced Packaging (Semiconductors)	1997	37
A 48nm 32Gb 8-level NAND flash memory with 5.5MB/s program throughput Seung-Ho Chang, Sok-Kyu Lee, Seong-Je Park, Non-volatile MemoryEngineeringMemory DesignEmerging Memory TechnologyComputer Architecture	2009	24
1 Giga bit SOI DRAM with fully bulk compatible process and body-contacted SOI MOSFET structure Yo-Hwan Koh, Min-Rok Oh, Jong‐Wook Lee, Electrical EngineeringSemiconductor DeviceEngineeringVlsi DesignAdvanced Packaging (Semiconductors)	2002	20
A 32Gb MLC NAND-flash memory with V<inf>th</inf>-endurance-enhancing schemes in 32nm CMOS Changhyuk Lee, Sok-Kyu Lee, Sunghoon Ahn, Non-volatile MemoryElectrical EngineeringEngineeringEmerging Memory TechnologyNm Cmos	2010	16
Body-contacted SOI MOSFET structure and its application to DRAM Yo-Hwan Koh, Min-Rok Oh, Jong‐Wook Lee, IEEE Transactions on Electron Devices Low-power ElectronicsElectrical EngineeringEngineeringVlsi DesignAdvanced Packaging (Semiconductors)	1998	13
NAND Flash reliability degradation induced by HCI in boosted channel potential Milim Park, Sukkwang Park, Seokwon Cho, EngineeringFlash Reliability DegradationComputer ArchitectureSystem ReliabilityHardware Security	2010	13
Effects of buried oxide on electrical performance of thin-film silicon-on-insulator metal–oxide–semiconductor field-effect transistor Jong‐Wook Lee, Min-Rok Oh, Yo-Hwan Koh Journal of Applied Physics Electrical EngineeringEngineeringBuried OxideBoron AtomsStress-induced Leakage Current	1999	11

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