F.M. Klaassen - Concepedia

Author

F.M. Klaassen

Philips (Netherlands)

Also Known As

F. Klaassen, F. M. KLAASSEN, F. M. Klaassen, F.M Klaassen, F.M. Klaassen, François M Klaassen, François M. Klaassen

Publications

1.5K

Citations

H-Index

Concepts

All Affiliations

Philips (Netherlands)Eindhoven University of Technology Philips (Finland)Nortel (Canada)Nuclear Research and Consultancy Group

About

F.M. Klaassen is an author at Philips (Netherlands) specializing in engineering, electrical engineering, and microelectronics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	19	27	1.1K
2	Applied Physics	14	15	589
3	Computer Engineering	11	11	558
4	Chemical Engineering	1	1	20
5	Chemistry	1	1	20

F.M. Klaassen

Publications

1.2K

Citations

H-Index

Page 1

	Year	Citations
Characterization of low 1/f noise in MOS transistors F.M. Klaassen IEEE Transactions on Electron Devices Device ModelingElectrical EngineeringSemiconductor DeviceEngineeringNanoelectronics	1971	153
An explicit surface-potential-based MOSFET model for circuit simulation R. van Langevelde, F.M. Klaassen Solid-State Electronics Device ModelingElectrical EngineeringEngineeringNumerical SimulationComputer Engineering	2000	129
Device physics of integrated injection logic F.M. Klaassen IEEE Transactions on Electron Devices Device ModelingLateral P-n-p TransistorElectrical EngineeringSemiconductor DeviceEngineering	1975	126
Effect of gate-field dependent mobility degradation on distortion analysis in MOSFETs R. van Langevelde, F.M. Klaassen IEEE Transactions on Electron Devices Device ModelingElectrical EngineeringSemiconductor DeviceEngineeringElectronic Engineering	1997	85
On the temperature coefficient of the MOSFET threshold voltage F.M. Klaassen, W. Hes Solid-State Electronics Device ModelingElectrical EngineeringEngineeringNanoelectronicsBias Temperature Instability	1986	76
Compact MOS modeling for analog circuit simulation R.M.D.A. Velghe, D.B.M. Klaassen, F.M. Klaassen Device ModelingCircuit SimulatorsElectrical EngineeringEngineeringCircuit System	2002	46
On the influence of hot carrier effects on the thermal noise of field-effect transistors F.M. Klaassen IEEE Transactions on Electron Devices EngineeringField-effect TransistorsMobility SaturationSemiconductor DeviceRf Semiconductor	1970	44
Design and performance of micron-size devices F.M. Klaassen Solid-State Electronics Electrical EngineeringEngineeringFlexible ElectronicsMicrofabricationComputer Engineering	1978	42
High-frequency noise of the junction field-effect transistor F.M. Klaassen IEEE Transactions on Electron Devices Device ModelingElectrical EngineeringEngineeringHigh-frequency DeviceHigh-frequency Noise	1967	42
Modelling of scaled-down MOS transistors F.M. Klaassen, W. Groot Solid-State Electronics Device ModelingElectrical EngineeringEngineeringCompact ModelingNanoelectronics	1980	40

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