H. Esaki

Electrical and physical characteristics of thin nitrided oxides prepared by rapid thermal nitridation

Takashi Hori, Hiroshi Iwasaki, Yasushi Naito et al. · IEEE Transactions on Electron Devices · 1987 · 122 citations

Natural Sciences, Materials Engineering, Materials Science +13

Interface states and fixed charges in nanometer-range thin nitrided oxides prepared by rapid thermal annealing

Takashi Hori, Yasushi Naito, Hiroshi Iwasaki et al. · IEEE Electron Device Letters · 1986 · 51 citations

Natural Sciences, Materials Engineering, Materials Science +17

SMART-P: rigorous three-dimensional process simulator on a supercomputer

S. Odanaka, H. Umimoto, M. Wakabayashi et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1988 · 44 citations

Engineering, Electrical Engineering, Materials Engineering +17

A mobility model for submicrometer MOSFET simulations including hot-carrier-induced device degradation

Akira Hiroki, S. Odanaka, K. Ohe et al. · IEEE Transactions on Electron Devices · 1988 · 35 citations

Engineering, Electrical Engineering, Microelectronics +16

A mobility model for submicrometer MOSFET device simulations

Akira Hiroki, S. Odanaka, K. Ohe et al. · IEEE Electron Device Letters · 1987 · 27 citations

Engineering, Electrical Engineering, Physics +17