Hassan Tanbakuchi

Statistics

Publications

Citations

495

H-Index

Active since

1989

Affiliations

Agilent Technologies (United States)(Current)

Centre National de la Recherche Scientifique

Institut d'électronique de microélectronique et de nanotechnologie

TU Wien

National Institute of Standards and Technology

Hassan Tanbakuchi is an author at Agilent Technologies (United States) specializing in electrical engineering, microwave engineering, and microwave measurements.

Publications per year

1989–2014

Publications

Calibrated nanoscale capacitance measurements using a scanning microwave microscope

H. Huber, Manuel Moertelmaier, Thomas M. Wallis et al. · Review of Scientific Instruments · 2010 · 144 citations

Engineering, Electrical Engineering, Materials Science +17

Calibrated nanoscale dopant profiling using a scanning microwave microscope

H. Huber, I. Humer, M. Hochleitner et al. · Journal of Applied Physics · 2012 · 90 citations

Engineering, Electrical Engineering, Materials Science +17

Quantitative scanning near-field microwave microscopy for thin film dielectric constant measurement

A. Karbassi, D. Ruf, Alan D. Bettermann et al. · Review of Scientific Instruments · 2008 · 76 citations

Natural Sciences, Electrical Engineering, Materials Science +17

An interferometric scanning microwave microscope and calibration method for sub-fF microwave measurements

Thomas Dargent, Kamel Haddadi, T. Lasri et al. · Review of Scientific Instruments · 2013 · 68 citations · Full text

Engineering, Electrical Engineering, Instrumentation +16

Frequency-selective contrast on variably doped p-type silicon with a scanning microwave microscope

A. Imtiaz, Thomas M. Wallis, Sang-Hwi Lim et al. · Journal of Applied Physics · 2012 · 51 citations

Natural Sciences, Electrical Engineering, Materials Science +17

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