Statistics
Publications
27
Citations
1.7K
H-Index
19
Active since
2000
Thomas M. Wallis is an author at National Institute of Standards and Technology specializing in engineering, applied physics, and physics.
Publications per year
2000–2020
27
27
Calibrated nanoscale dopant profiling using a scanning microwave microscope
H. Huber, I. Humer, M. Hochleitner et al. · Journal of Applied Physics · 2012 · 90 citations
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