R. A. Kjar

Sub-micron chip ESD protection schemes which avoid avalanching junctions

E. Worley, Ratnesh Gupta, B.E. Jones et al. · 1995 · 109 citations

Hardware Security, Electrical Engineering, Engineering +10

Radiation induced leakage current in N-channel SOS transistors

R. A. Kjar, J. L. Peel · IEEE Transactions on Nuclear Science · 1974 · 36 citations

Electrical Engineering, Engineering, Physics +10

Island-edge effects in C-MOS/SOS transistors

S.N. Lee, R. A. Kjar, G. Kinoshita · IEEE Transactions on Electron Devices · 1978 · 28 citations

Electrical Engineering, Engineering, Nanoelectronics +11

Transient Photocurrents in SOS Structures

R. A. Kjar, G. Kinoshita · IEEE Transactions on Nuclear Science · 1973 · 26 citations

Transient Grating, Engineering, Junction Photocurrents +16

Radiation-Induced Surface States in MOS Devices

R. A. Kjar, D. K. Nichols · IEEE Transactions on Nuclear Science · 1975 · 17 citations

Electrical Engineering, Semiconductor Device, Engineering +11