Peter C. Moon

A 45nm Logic Technology with High-k+Metal Gate Transistors, Strained Silicon, 9 Cu Interconnect Layers, 193nm Dry Patterning, and 100% Pb-free Packaging

K. Mistry, R. Chau, Changhwan Choi et al. · 2007 · 825 citations

Nm Logic Technology, Engineering, Vlsi Design +18

In vitro comparison of the fracture resistance and failure mode of fiber, ceramic, and conventional post systems at various stages of restoration

Clarence J. Cormier, David R. Burns, Peter C. Moon · Journal of Prosthodontics · 2001 · 218 citations

Evaluation of setting properties and retention characteristics of mineral trioxide aggregate when used as a furcation perforation repair material

S.R. Sluyk, Peter C. Moon, Gary Hartwell · Journal of Endodontics · 1998 · 183 citations

Materials Science, Chemical Engineering, Cementation +8

Placement of Mineral Trioxide Aggregate Using Two Different Techniques

Anita Aminoshariae, Gary Hartwell, Peter C. Moon · Journal of Endodontics · 2003 · 155 citations · Full text

A Quantitative Comparison of the Fill Density of MTA Produced by Two Placement Techniques

Priscilla Yeung, F LIEWEHR, Peter C. Moon · Journal of Endodontics · 2006 · 97 citations

Geotechnical Engineering, Materials Science, Engineering +6