A.P. Dorey

Sensors for microprocessor-based applications

J.E. Brignell, A.P. Dorey · Journal of Physics E Scientific Instruments · 1983 · 36 citations

Engineering, Measurement, Computer Architecture +19

The effect of strain on MOS transistors

A.P. Dorey, T.S. Maddern · Solid-State Electronics · 1969 · 34 citations

Electrical Engineering, Engineering, Stress-induced Leakage Current +5

A design-for-test structure for optimising analogue and mixed signal IC test

A.H. Bratt, A. Richardson, Russell Harvey et al. · European Design and Test Conference · 1995 · 28 citations

Engineering, Measurement, Analog Design +16

The variation of resistance of gold films with time and annealing procedure

A.P. Dorey, John M. Knight · Thin Solid Films · 1969 · 23 citations

Materials Engineering, Materials Science, Material Analysis +10

Mixed signal test — techniques, applications and demands

K. Baker, A. Richardson, A.P. Dorey · IEE Proceedings - Circuits Devices and Systems · 1996 · 23 citations

Engineering, Measurement, Mem Testing +18