R.J. Chater

Oxygen exchange and diffusion measurements: The importance of extracting the correct initial and boundary conditions

R.J. Chater · Solid State Ionics · 2005 · 85 citations

Boundary Conditions, Diffusion Resistance, Oxygen Exchange +8

Ion beam synthesis of thin buried layers of SiO2 in silicon

P.L.F. Hemment, KJ Reeson, R.J. Chater et al. · Vacuum · 1986 · 64 citations

Materials Science, Thin Buried Layers, Ion Implantation +7

High quality silicon on insulator structures formed by the thermal redistribution of implanted nitrogen

P.L.F. Hemment, R. F. Peart, Maoqing Yao et al. · Applied Physics Letters · 1985 · 58 citations

Engineering, Si-si3n4 Interfaces, Integrated Circuits +16

Novel dielectric/silicon planar structures formed by ion beam synthesis

P.L.F. Hemment, K.J. Reeson, John A. Kilner et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1987 · 34 citations

Electrical Engineering, Ion Implantation, Engineering +5

Silicon on insulator structures formed by the implantation of high doses of reactive ions

P.L.F. Hemment, R. F. Peart, Maoqing Yao et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1985 · 28 citations

Materials Science, Electrical Engineering, Insulator Structures +13