T. Pavelka

Correlation of the concentration of the carbon-associated radiation damage levels with the total carbon concentration in silicon

G. Ferenczi, C. A. Londos, T. Pavelka et al. · Journal of Applied Physics · 1988 · 58 citations

Cs-sii-cs Complex, Nuclear Physics, Engineering +18

Isothermal frequency scan DLTS

G. Ferenczi, J. Boda, T. Pavelka · physica status solidi (a) · 1986 · 48 citations

Electrical Engineering, Engineering, Nondestructive Testing +5

Silicon epitaxial layer recombination and generation lifetime characterization

D.K. Schroder, Byoungdeog Choi, S.G. Kang et al. · IEEE Transactions on Electron Devices · 2003 · 31 citations

Electrical Engineering, Carrier Generation, Engineering +14

Quantitative copper measurement in oxidized p-type silicon wafers using microwave photoconductivity decay

Hele Väinölä, E. Saarnilehto, Marko Yli‐Koski et al. · Applied Physics Letters · 2005 · 27 citations · Full text

Semiconductor Technology, Electrical Engineering, Engineering +15

Injection Level Spectroscopy: A Novel Non-Contact Contamination Analysis Technique in Silicon

G. Ferenczi, T. Pavelka, P. Tüttő · Japanese Journal of Applied Physics · 1991 · 17 citations

Engineering, Silicon On Insulator, Excitation Light Intensity +22