Yoon-Ha Jeong

PBTI-Associated High-Temperature Hot Carrier Degradation of nMOSFETs With Metal-Gate/High- $k$ Dielectrics

Kyong Taek Lee, Chang Yong Kang, Ook Sang Yoo et al. · IEEE Electron Device Letters · 2008 · 43 citations

Engineering, Electrical Engineering, Materials Engineering +17

A novel phase measurement technique for IM3 components in RF power amplifiers

Seung-Yup Lee, Yong‐Sub Lee, Yoon-Ha Jeong · IEEE Transactions on Microwave Theory and Techniques · 2006 · 29 citations

Engineering, Electrical Engineering, Analog Electronics +16

Atomic layer deposition of Al2O3 on V2O5 xerogel film for enhanced lithium-ion intercalation stability

Dawei Liu, Stephanie L. Candelaria, Guozhong Cao et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 2011 · 20 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17

Phase Separation of Ni Germanide Formed on a Ge-on-Si Structure for Ge MOSFETs

Ying-Ying Zhang, Jungwoo Oh, Tae‐Sung Bae et al. · Electrochemical and Solid-State Letters · 2007 · 12 citations · Full text

Engineering, Electrical Engineering, Materials Science +13

Effects of source and load impedance on the intermodulation products of GaAs FETs

Kwang‐Ho Ahn, Yoon-Ha Jeong, Soong-Hak Lee · 2002 · 11 citations

Engineering, Electrical Engineering, Circuit Theory +15