V. Em. Vamvakas - Concepedia

Author

V. Em. Vamvakas

National Centre of Scientific Research "Demokritos"

Also Known As

V E Vamvakas, V Em Vamvakas, V. EM. VAMVAKAS, V. Em. Vamvakas, V. Vamvakas, V.E. Vamvakas, V.Em. Vamvakas, Vassilios Em. Vamvakas

Publications

374

Citations

H-Index

Concepts

All Affiliations

National Centre of Scientific Research "Demokritos"Centre National de la Recherche Scientifique Centre d’Élaboration de Matériaux et d’Études Structurales

About

V. Em. Vamvakas is an author at National Centre of Scientific Research "Demokritos" specializing in engineering, applied physics, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	6	6	302
2	Applied Physics	6	6	302
3	Materials Science	6	6	302
4	Electrical Engineering	2	2	33
5	Physics	1	1	23

V. Em. Vamvakas

Publications

326

Citations

H-Index

Page 1

	Year	Citations
Optical and structural properties of copper oxide thin films grown by oxidation of metal layers G. Papadimitropoulos, N. Vourdas, V. Em. Vamvakas, Thin Solid Films Materials ScienceStructural PropertiesCopper Oxide MaterialsOptical MaterialsEngineering	2006	132
Deposition and characterization of copper oxide thin films G. Papadimitropoulos, N. Vourdas, V. Em. Vamvakas, Journal of Physics Conference Series Materials ScienceCopper Oxide MaterialsEngineeringMaterial AnalysisNanomaterials	2005	98
Picosecond and nanosecond laser annealing and simulation of amorphous silicon thin films for solar cell applications Ioannis Theodorakos, I. Zergioti, V. Em. Vamvakas, Journal of Applied Physics Materials ScienceSolar Cell ApplicationsElectrical EngineeringSolid State LaserEngineering	2014	23
FTIR characterization of light emitting Si-rich nitride films prepared by low pressure chemical vapor deposition V. Em. Vamvakas, S. Gardelis Surface and Coatings Technology Materials ScienceEngineeringSi-rich Nitride FilmsFtir CharacterizationOptical Properties	2007	22
Optical characterization of Si-rich silicon nitride films prepared by low pressure chemical vapor deposition V. Em. Vamvakas, N. Vourdas, S. Gardelis Microelectronics Reliability Materials ScienceOptical MaterialsEngineeringOptical PropertiesSilicon On Insulator	2007	17
Oxide–nitride–oxide dielectric stacks with Si nanoparticles obtained by low-energy ion beam synthesis V. Ioannou-Sougleridis, Panagiotis Dimitrakis, V. Em. Vamvakas, Nanotechnology	2007	14
Wet oxidation of nitride layer implanted with low-energy Si ions for improved oxide-nitride-oxide memory stacks V. Ioannou-Sougleridis, Panagiotis Dimitrakis, V. Em. Vamvakas, Applied Physics Letters EngineeringEmerging Memory TechnologyWet OxidationOptoelectronic DevicesIntegrated Circuits	2007	10
Thermodynamic study, compositional and electrical characterization of LPCVD SiO2 films grown from TEOS/N2O mixtures V. Em. Vamvakas, Dimitris Davazoglou, Constantin Vahlas Microelectronics Reliability	1998	10

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