T. H. Metzger - Concepedia

Author

T. H. Metzger

Also Known As

Metzger, T. H., T H Metzger, T Metzger, T. H Metzger, T. H. Metzger, T. Metzger, T.-H. Metzger, T.H Metzger, T.H. Metzger, Till H. Metzger

143

Publications

2.9K

Citations

H-Index

112

Concepts

All Affiliations

European Synchrotron Radiation Facility Centre National de la Recherche Scientifique Ludwig-Maximilians-Universität München Johannes Kepler University of Linz European Science Foundation

About

T. H. Metzger is an author at European Synchrotron Radiation Facility specializing in engineering, applied physics, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	29	70	2.3K
2	Applied Physics	26	60	1.9K
3	Natural Sciences	10	10	392
4	Health Sciences	4	4	115
5	Medicine	2	2	182

T. H. Metzger

Publications

2.6K

Citations

H-Index

Page 1

	Year	Citations
Three-dimensional high-resolution quantitative microscopy of extended crystals P. Godard, Marc Allain, Francesca Mastropietro, Nature Communications EngineeringMicroscopyMicroscopy MethodExtended CrystalsSuper-resolution	2011	157
Kinetic Roughness of Amorphous Multilayers Studied by Diffuse X-Ray Scattering Tim Salditt, T. H. Metzger, J. Peisl Physical Review Letters Materials ScienceMagnetismSurface CharacterizationEngineeringPhysics	1994	151
Direct Determination of Strain and Composition Profiles in SiGe Islands by Anomalous X-Ray Diffraction at High Momentum Transfer Tobias U. Schülli, J. Stangl, Zhenyang Zhong, Physical Review Letters	2003	116
X-ray imaging and diffraction from surface phonons on GaAs WHH Sauer, M. Streibl, T. H. Metzger, Applied Physics Letters Optical MaterialsEngineeringSurface Acoustic WavesSemiconductor NanostructuresSemiconductors	1999	85
Beyond the ensemble average: X-ray microdiffraction analysis of single SiGe islands Cristian Mocuta, J. Stangl, K. Mundboth, Physical Review B X-ray CrystallographyX-ray SpectroscopyEngineeringMicroscopyX-ray Fluorescence	2008	70
Temperature influence on the production of nanodot patterns by ion beam sputtering of Si(001) R. Gago, L. Vázquez, O. Plantevin, Physical Review B EngineeringIon Beam SputteringSilicon On InsulatorIon ImplantationNanoelectronics	2006	67
Coherent diffraction imaging of a single epitaxial InAs nanowire using a focused x-ray beam Ana Díaz, Cristian Mocuta, J. Stangl, Physical Review B Electrical EngineeringCross SectionFresnel Zone PlateEngineeringPhysics	2009	61
Influence of growth temperature on interdiffusion in uncapped SiGe-islands on Si(001) determined by anomalous x-ray diffraction and reciprocal space mapping Tobias U. Schülli, M. Stoffel, A. Hesse, Physical Review B Island SizeEngineeringCrystal Growth TechnologySilicon On InsulatorUncapped Sige-islands	2005	59
Order enhancement and coarsening of self-organized silicon nanodot patterns induced by ion-beam sputtering R. Gago, L. Vázquez, O. Plantevin, Applied Physics Letters EngineeringIon-beam SputteringSilicon On InsulatorBeam LithographyIon Beam	2006	59
Ordered Micro/Mesoporous Composite Prepared as Thin Films Nikolay Petkov, M. Hölzl, T. H. Metzger, The Journal of Physical Chemistry B Materials ScienceMolecular SieveChemical EngineeringEngineeringNanoporous Material	2005	56

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