T. H. Metzger

Three-dimensional high-resolution quantitative microscopy of extended crystals

P. Godard, Marc Allain, Francesca Mastropietro et al. · Nature Communications · 2011 · 157 citations · Full text

Engineering, Microscopy, Microscopy Method +6

Kinetic Roughness of Amorphous Multilayers Studied by Diffuse X-Ray Scattering

Tim Salditt, T. H. Metzger, J. Peisl · Physical Review Letters · 1994 · 151 citations · Full text

Materials Science, Magnetism, Surface Characterization +15

Direct Determination of Strain and Composition Profiles in SiGe Islands by Anomalous X-Ray Diffraction at High Momentum Transfer

Tobias U. Schülli, J. Stangl, Zhenyang Zhong et al. · Physical Review Letters · 2003 · 116 citations

X-ray imaging and diffraction from surface phonons on GaAs

WHH Sauer, M. Streibl, T. H. Metzger et al. · Applied Physics Letters · 1999 · 85 citations · Full text

Optical Materials, Engineering, Surface Acoustic Waves +18

Beyond the ensemble average: X-ray microdiffraction analysis of single SiGe islands

Cristian Mocuta, J. Stangl, K. Mundboth et al. · Physical Review B · 2008 · 70 citations

X-ray Crystallography, X-ray Spectroscopy, Engineering +23