Concepedia

Michael T. Stocker

MT

Statistics

Publications

10

Citations

213

H-Index

10

Active since

2002

Affiliations

National Institute of Standards and Technology(Current)

Michael T. Stocker is an author at National Institute of Standards and Technology specializing in engineering, optical properties, and microscopy.

Top concepts

EngineeringOptical PropertiesMicroscopyOptical MetrologyPhotonic MetrologyOptical System AnalysisPhotonicsOptical SystemsOptical TolerancingDesign

Publications per year

2002–2009

10

Publications

10

Scatterfield microscopy for extending the limits of image-based optical metrology

Richard M. Silver, Brian M. Barnes, Ravikiran Attota et al. · Applied Optics · 2007 · 69 citations

Engineering, Microscopy, Super-resolution Microscopy +17

Application of through-focus focus-metric analysis in high resolution optical metrology

Ravikiran Attota, Richard M. Silver, Thomas A. Germer et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2005 · 23 citations

Engineering, Microscopy, Optic Design +19

High-resolution optical metrology

Richard M. Silver, Ravikiran Attota, Michael T. Stocker et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2005 · 20 citations

Light Field Imaging, Engineering, Coherent Gradient Sensing +10

High-resolution optical overlay metrology

Richard M. Silver, Ravikiran Attota, Michael T. Stocker et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2004 · 19 citations

Geometric Modeling, Photonics, Engineering +15

Updated NIST photomask linewidth standard

James E. Potzick, Joseph Pedulla, Michael T. Stocker · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2003 · 17 citations

1–5 of 10