Y. Seki

Reliability of power cycling for igbt power semiconductor modules

Akira Morozumi, Kodai Yamada, Toru MIYASAKA et al. · IEEE Transactions on Industry Applications · 2003 · 244 citations

Engineering, Lead-based Solder, Mechanical Engineering +16

A study on the short-circuit capability of field-stop igbts

M. Otsuki, Yuichi Onozawa, H. Kanemaru et al. · IEEE Transactions on Electron Devices · 2003 · 86 citations

Electrical Engineering, Semiconductor Device, Engineering +9

New IGBT modules for advanced neutral-point-clamped 3-level power converters

K. Komatsu, Makoto Yatsu, S. Miyashita et al. · 2010 · 66 citations

Electrical Engineering, Engineering, Power Device +8

Development of the next generation 1200V trench-gate FS-IGBT featuring lower EMI noise and lower switching loss

Yuichi Onozawa, Hiroki Nakano, M. Otsuki et al. · 2007 · 48 citations

Low-power Electronics, Electrical Engineering, Next Generation 1200 +14

The guard-ring termination for the high-voltage SiC Schottky barrier diodes

K. Ueno, T. Urushidani, Kazuhide Hashimoto et al. · IEEE Electron Device Letters · 1995 · 46 citations

Semiconductor Technology, Electrical Engineering, Semiconductor Device +10