Hallvard Angelskår

Metasurface Fabrication by Cryogenic and Bosch Deep Reactive Ion Etching

Angela Baracu, Christopher A. Dirdal, Andrei Avram et al. · Micromachines · 2021 · 38 citations · Full text

Bosch Drie, Si Pillars, Optical Materials +24

Studying Light-Induced Degradation by Lifetime Decay Analysis: Excellent Fit to Solution of Simple Second-Order Rate Equation

Tine Uberg Nærland, H. Haug, Hallvard Angelskår et al. · IEEE Journal of Photovoltaics · 2013 · 33 citations · Full text

Engineering, Degradation Reaction, Silicon On Insulator +17

Direct monitoring of minority carrier density during light induced degradation in Czochralski silicon by photoluminescence imaging

Tine Uberg Nærland, Hallvard Angelskår, Erik Stensrud Marstein · Journal of Applied Physics · 2013 · 23 citations · Full text

Optical Materials, Engineering, Optoelectronic Devices +20

Characterization of Oxidation-Induced Stacking Fault Rings in Cz Silicon: Photoluminescence Imaging and Visual Inspection After Wright etch

Hallvard Angelskår, Rune Søndenå, Marie Syre Wiig et al. · Energy Procedia · 2012 · 18 citations · Full text

Engineering, Thermal Oxidation, Photoluminescence Imaging +17

Characterization of the OSF-band structure in n-type Cz-Si using photoluminescence-imaging and visual inspection

Rune Søndenå, Yu Hu, Mari Juel et al. · Journal of Crystal Growth · 2013 · 16 citations

Ii-vi Semiconductor, Visual Inspection, Electrical Engineering +7