Marie Syre Wiig

Impurity control in high performance multicrystalline silicon

Gaute Stokkan, Rune Søndenå, Mari Juel et al. · physica status solidi (a) · 2017 · 32 citations

Engineering, Materials Engineering, Materials Science +17

Hydrogen-related defects measured by infrared spectroscopy in multicrystalline silicon wafers throughout an illuminated annealing process

Philip Weiser, E. V. Monakhov, H. Haug et al. · Journal of Applied Physics · 2020 · 26 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17

Characterization of Oxidation-Induced Stacking Fault Rings in Cz Silicon: Photoluminescence Imaging and Visual Inspection After Wright etch

Hallvard Angelskår, Rune Søndenå, Marie Syre Wiig et al. · Energy Procedia · 2012 · 19 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +16

Temperature dependent photoluminescence imaging calibrated by photoconductance measurements

H. Haug, Rune Søndenå, Marie Syre Wiig et al. · Energy Procedia · 2017 · 18 citations · Full text

Engineering, Electrical Engineering, Materials Engineering +15

Characterization of the OSF-band structure in n-type Cz-Si using photoluminescence-imaging and visual inspection

Rune Søndenå, Yu Hu, Mari Juel et al. · Journal of Crystal Growth · 2013 · 16 citations

Engineering, Materials Engineering, Materials Science +14