Tine Uberg Nærland

Origin of the low carrier lifetime edge zone in multicrystalline PV silicon

Tine Uberg Nærland, L. Arnberg, A. Holt · Progress in Photovoltaics Research and Applications · 2008 · 56 citations

Materials Science, Electrical Engineering, Engineering +14

Silicon Minority-carrier Lifetime Degradation During Molecular Beam Heteroepitaxial III-V Material Growth

Laura Ding, Chaomin Zhang, Tine Uberg Nærland et al. · Energy Procedia · 2016 · 34 citations · Full text

Materials Science, Semiconductors, Electrical Engineering +12

Studying Light-Induced Degradation by Lifetime Decay Analysis: Excellent Fit to Solution of Simple Second-Order Rate Equation

Tine Uberg Nærland, H. Haug, Hallvard Angelskår et al. · IEEE Journal of Photovoltaics · 2013 · 33 citations · Full text

Engineering, Degradation Reaction, Silicon On Insulator +17

Fast and slow lifetime degradation in boron‐doped Czochralski silicon described by a single defect

Brett Hallam, Malcolm Abbott, Tine Uberg Nærland et al. · physica status solidi (RRL) - Rapid Research Letters · 2016 · 33 citations

Engineering, Single Defect, Chemistry +16

Recent insights into boron-oxygen related degradation: Evidence of a single defect

Brett Hallam, Moonyong Kim, Malcolm Abbott et al. · Solar Energy Materials and Solar Cells · 2017 · 26 citations

Boron Nitride, Engineering, Positron Annihilation Spectroscopy +8