C. F. Dunn

A model for stress-induced metal notching and voiding in very large-scale-integrated Al–Si (1%) metallization

J. W. McPherson, C. F. Dunn · Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena · 1987 · 178 citations

Engineering, Materials Engineering, Materials Science +17

The prevalence and demographic correlates of stress, anxiety, and depression among veterinary students in the Southeastern United States

Vinayak K. Nahar, Robert E. Davis, C. F. Dunn et al. · Research in Veterinary Science · 2019 · 52 citations

Veterinary Medicine, Veterinary Epidemiology, Veterinary Public Health +8

Mechanical properties and microstructures of Al-1%Si thin film metallizations

A. J. Griffin, F. R. Brotzen, C. F. Dunn · Thin Solid Films · 1987 · 45 citations

Natural Sciences, Materials Engineering, Materials Science +12

Temperature-cycling acceleration factors for aluminium metallization failure in VLSI applications

C. F. Dunn, J. W. McPherson · 2002 · 33 citations

Engineering, Materials Engineering, Materials Science +17

Hall-petch relation in thin film metallizations

A. J. Griffin, F. R. Brotzen, C. F. Dunn · Scripta Metallurgica · 1986 · 32 citations

Natural Sciences, Materials Science, Physics +9