Kuo-Ting Chu

Influence of displacement damage induced by neutron irradiation on effective carrier density in 4H-SiC SBDs and MOSFETs

Der-Sheng Chao, Hua-Yu Shih, Jheng-Yi Jiang et al. · Japanese Journal of Applied Physics · 2019 · 27 citations

Electrical Engineering, Engineering, Displacement Damage +14

Avalanche ruggedness and reverse-bias reliability of SiC MOSFET with integrated junction barrier controlled Schottky rectifier

Cheng-Tyng Yen, Fu-Jen Hsu, Chien‐Ching Hung et al. · 2018 · 20 citations

Sic Mosfet, Semiconductor Technology, Electrical Engineering +13

Field emission properties of zinc oxide/zinc tungstate (ZnO/ZnWO 4 ) composite nanorods

Bohr‐Ran Huang, Tzu-Ching Lin, Kuo-Ting Chu et al. · Surface and Coatings Technology · 2012 · 17 citations

Materials Science, Field Emission Properties, Zinc Oxide/zinc Tungstate +8

High accuracy large-signal SPICE model for silicon carbide MOSFET

Fu-Jen Hsu, Cheng-Tyng Yen, Chien‐Ching Hung et al. · 2018 · 16 citations

Device Modeling, Numerical Analysis, Electrical Engineering +13

Short-Circuit Ruggedness Analysis of SiC JMOS and DMOS

Fu-Jen Hsu, Cheng-Tyng Yen, Chien‐Ching Hung et al. · 2019 · 14 citations

Sic Jmos, Electrical Engineering, Body Diode +11