Chun-Chen Yeh

A 7nm FinFET technology featuring EUV patterning and dual strained high mobility channels

Ruijie Xie, P. Montanini, Kerem Akarvardar et al. · 2016 · 144 citations

Engineering, Electrical Engineering, Materials Science +15

A 0.063 µm<sup>2</sup> FinFET SRAM cell demonstration with conventional lithography using a novel integration scheme with aggressively scaled fin and gate pitch

V. Basker, T. Standaert, Hikaru Kawasaki et al. · 2010 · 60 citations

Engineering, Computer Engineering, Electrical Engineering +11

Capacitor-based Cross-point Array for Analog Neural Network with Record Symmetry and Linearity

Y. Li, Seyoung Kim, Xiaoyu Sun et al. · 2018 · 44 citations

Engineering, Computer Engineering, Electrical Engineering +12

Sub-25nm FinFET with advanced fin formation and short channel effect engineering

Takashi Yamashita, V. Basker, T. Standaert et al. · Symposium on VLSI Technology · 2011 · 34 citations

Engineering, Electrical Engineering, Microelectronics +16

Comprehensive study of effective current variability and MOSFET parameter correlations in 14nm multi-fin SOI FINFETs

A. Paul, A. Bryant, Terence B. Hook et al. · 2013 · 31 citations

Engineering, Electrical Engineering, Microelectronics +16