E. J. Puik - Concepedia

Author

E. J. Puik

Institute for Atomic and Molecular Physics

Also Known As

E J Puik, E J. Puik, E PUIK, E Puik, E. J. Puik, E. J. Puik., E. Puik, E.J Puik, E.J. Puik, Eric J. Puik

Publications

216

Citations

H-Index

Concepts

All Affiliations

Institute for Atomic and Molecular Physics

About

E. J. Puik is an author at Institute for Atomic and Molecular Physics specializing in engineering, applied physics, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	6	6	157
2	Applied Physics	6	6	157
3	Materials Science	6	6	157
4	Physics	2	2	55
5	Health Sciences	1	1	10

E. J. Puik

Publications

182

Citations

H-Index

Page 1

	Year	Citations
Modification by Ar and Kr ion bombardment of Mo/Si X-ray multilayers Rutger Schlatmann, Chao Lü, J. Verhoeven, Applied Surface Science Materials ScienceIon ImplantationMo/si X-ray MultilayersX-ray SpectroscopyEngineering	1994	45
Ion bombardment of X-ray multilayer coatings: Comparison of ion etching and ion assisted deposition E. J. Puik, M.J. van der Wiel, H. Zeijlemaker, Applied Surface Science Materials ScienceIon ImplantationIon EtchingEngineeringIon Bombardment	1991	32
Ion etching of thin W layers: enhanced reflectivity of W-C multilayer coatings E. J. Puik, M.J. van der Wiel, H. Zeijlemaker, Applied Surface Science Materials ScienceIon EtchingEngineeringW-c Multilayer CoatingsSurface Science	1991	29
Ion bombardment of thin layers: The effect on the interface roughness and its x-ray reflectivity (invited) E. J. Puik, M.J. van der Wiel, H. Zeijlemaker, Review of Scientific Instruments Materials ScienceThin LayersIon ImplantationEngineeringCrystalline Defects	1992	21
Ion-beam-assisted deposition of Ni/C multilayer X-ray mirrors E. J. Puik, M.J. van der Wiel, J. Verhoeven, Thin Solid Films Materials ScienceIon-beam-assisted DepositionEngineeringSurface ScienceApplied Physics	1990	20
Characterization of a multilayer coated laminar reflection grating at λ = 0.154 nm E. J. Puik Journal of X-Ray Science and Technology	1991	13
Ion beam modification of MoSi multilayer systems for X-ray reflection J. Verhoeven, Chunguang Lu, E. J. Puik, Applied Surface Science	1992	12
Multilayer X-Ray Mirrors; The State Of The Art. M. P. Bruijn, J. Verhoeven, E. J. Puik, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Optical MaterialsEngineeringMicroscopyEnergy ResolutionX-ray Imaging	1988	10

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