D.V. Sridhara Rao

Ti Al N ∕ Ti Al O N ∕ Si 3 N 4 tandem absorber for high temperature solar selective applications

Harish C. Barshilia, N. Selvakumar, K.S. Rajam et al. · Applied Physics Letters · 2006 · 137 citations

Materials Engineering, Materials Science, Chemical Engineering +14

On the origin of threading dislocations in GaN films

M. A. Moram, C. S. Ghedia, D.V. Sridhara Rao et al. · Journal of Applied Physics · 2009 · 126 citations

Materials Science, Semiconductors, Uniform Luminescence +14

Equilibrium critical thickness for misfit dislocations in III-nitrides

David Holec, Yucheng Zhang, D.V. Sridhara Rao et al. · Journal of Applied Physics · 2008 · 113 citations

Materials Engineering, Materials Science, Critical Thickness +15

Deposition and characterization of TiAlN/TiAlON/Si3N4 tandem absorbers prepared using reactive direct current magnetron sputtering

Harish C. Barshilia, N. Selvakumar, K.S. Rajam et al. · Thin Solid Films · 2007 · 96 citations

Materials Engineering, Materials Science, Electrical Engineering +5

Metal location and thickness in a multilayered sheet by measuring Kα/Kβ, Lα/Lβ and Lα/Lγ X-ray ratios

Roberto Cesareo, M. A. Rizzutto, Antonio Brunetti et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2009 · 57 citations

Materials Science, Surface Characterization, Engineering +9