J.‐P. Raskin - Concepedia

Author

J.‐P. Raskin

Also Known As

J-P Raskin, J. P. Raskin, J. Raskin, J.-P. RASKIN, J.-P. Raskin, J.P. Raskin, J.‐P. Raskin, J.–P. Raskin, Raskin, J.-P., Raskin, J.P.

Publications

1.2K

Citations

H-Index

Concepts

All Affiliations

UCLouvain University of Antwerp IMEC KU Leuven CEA Grenoble

About

J.‐P. Raskin is an author at UCLouvain specializing in engineering, applied physics, and electrical engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	17	21	885
2	Applied Physics	11	12	625
3	Electrical Engineering	11	13	552
4	Computer Engineering	2	2	32
5	Biomolecular Engineering	1	1	67

J.‐P. Raskin

Publications

1.1K

Citations

H-Index

Page 1

	Year	Citations
Influence of device engineering on the analog and RF performances of SOI MOSFETs Valeriya Kilchytska, Amaury Nève, Laurent Vancaillie, IEEE Transactions on Electron Devices EngineeringAnalog DesignRf PerformancesPower ElectronicsDevice Engineering	2003	227
Comparison of TiSi2 , CoSi2, and NiSi for Thin‐Film Silicon‐on‐Insulator Applications J. Chen, J.P. Colinge, Denis Flandre, Journal of The Electrochemical Society	1997	106
Electrical detection of DNA hybridization: Three extraction techniques based on interdigitated Al/Al2O3 capacitors L. Moreno-Hagelsieb, Boris Foultier, G. Laurent, Biosensors and Bioelectronics Dna NanotechnologyDna HybridizationEngineeringCapillary ElectrophoresisBioelectronics	2006	67
A novel parametric-effect MEMS amplifier J.‐P. Raskin, A. R. Brown, B.T. Khuri-Yakub, Journal of Microelectromechanical Systems Input SignalElectrical EngineeringEngineeringMechanical Parametric-effect AmplifierMicrofabrication	2000	64
Advanced TEM investigation of the plasticity mechanisms in nanocrystalline freestanding palladium films with nanoscale twins B. Wang, Hosni Idrissi, Montserrat Galcerán, International Journal of Plasticity Materials ScienceAdvanced Tem InvestigationOne-dimensional MaterialEngineeringNanomaterials	2012	58
High strength-ductility of thin nanocrystalline palladium films with nanoscale twins: On-chip testing and grain aggregate model Marie-Stéphane Colla, B. Wang, Hosni Idrissi, Acta Materialia Materials ScienceNanosheetEngineeringOn-chip TestingNanomaterials	2012	57
Perspective of FinFETs for analog applications Valeriya Kilchytska, Nadine Collaert, R. Rooyackers, Electrical EngineeringEngineeringVlsi DesignTechnology ScalingNanoelectronics	2004	51
Impact of self-heating and substrate effects on small-signal output conductance in UTBB SOI MOSFETs S. Makovejev, J.‐P. Raskin, M. K. Md Arshad, Solid-State Electronics Electrical EngineeringEngineeringRf SemiconductorElectronic EngineeringUtbb Soi Mosfets	2011	49
Internal stress relaxation based method for elastic stiffness characterization of very thin films A. Boé, A. Safi, Michaël Coulombier, Thin Solid Films Materials ScienceEngineeringMechanical BehaviorMechanicsInternal Stress Relaxation	2009	41
Imperfection-sensitive ductility of aluminium thin films Michaël Coulombier, A. Boé, Charles Brugger, Scripta Materialia Materials EngineeringMaterials ScienceAluminium NitrideEngineeringAluminium Thin Films	2010	40

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