M. A. A. de Melo

Ionizing radiation hardness tests of GaN HEMTs for harsh environments

Alexis C. Vilas-Bôas, M. A. A. de Melo, R.B.B. Santos et al. · Microelectronics Reliability · 2020 · 40 citations · Full text

Engineering, Materials Engineering, Radiation Physics +12

Radiation Hardness of GaN HEMTs to TID Effects: COTS for harsh environments

Alexis C. Vilas-Bôas, M. A. A. de Melo, R.B.B. Santos et al. · 2019 · 14 citations

Engineering, Electrical Engineering, Electronic Materials +16

First Successful SEE Measurements with Heavy Ions in Brazil

N. H. Medina, N. Added, Vitor A. P. Aguiar et al. · 2014 · 12 citations

Engineering, Nuclear Engineering, Instrumentation +6

A Commercial off-the-shelf pMOS Transistor as X-ray and Heavy Ion Detector

M. A. A. de Melo, Vitor A. P. Aguiar, A. Rallo et al. · Journal of Physics Conference Series · 2015 · 12 citations · Full text

Engineering, Nuclear Engineering, Radiation Detection +16