Gerard Ghibaudo

Unexpected mobility degradation for very short devices : A new challenge for CMOS scaling

Antoine Cros, K. Romanjek, Dominique Fleury et al. · 2006 · 121 citations

Engineering, Electrical Engineering, Materials Science +17

Origin of low-frequency noise in pentacene field-effect transistors

Yong Xu, Takeo Minari, Kazuhito Tsukagoshi et al. · Solid-State Electronics · 2011 · 57 citations

Engineering, Chemistry, Electrical Engineering +14

Significant roles of low-temperature post-metallization annealing in solution-processed oxide thin-film transistors

Yong Xu, Chuan Liu, Paul S.K. Amegadze et al. · Applied Physics Letters · 2014 · 32 citations

Engineering, Materials Engineering, Materials Science +17

Refined Conformal Mapping Model for MOSFET Parasitic Capacitances Based on Elliptic Integrals

Gaspard Hiblot, Quentin Rafhay, Gerard Ghibaudo · IEEE Transactions on Electron Devices · 2015 · 24 citations

Engineering, Computer Engineering, Electrical Engineering +17

Joule's law for organic transistors exploration: Case of contact resistance

Yong Xu, Chuan Liu, Yun Li et al. · Journal of Applied Physics · 2013 · 23 citations

Engineering, Electrical Engineering, Physics +17