Simon Wing-Bun Tam

Extraction of Trap States at the Oxide-Silicon Interface and Grain Boundary for Polycrystalline Silicon Thin-Film Transistors

Mutsumi Kimura, Ryoichi Nozawa, Satoshi Inoue et al. · Japanese Journal of Applied Physics · 2001 · 47 citations

Engineering, Electrical Engineering, Materials Science +17

Extraction of trap states in laser-crystallized polycrystalline-silicon thin-film transistors and analysis of degradation by self-heating

Mutsumi Kimura, Satoshi Inoue, Tatsuya Shimoda et al. · Journal of Applied Physics · 2002 · 31 citations

Engineering, Electrical Engineering, Materials Science +17

Investigation of the low field leakage current mechanism in polysilicon TFT's

O.K.B. Lui, M. Quinn, Simon Wing-Bun Tam et al. · IEEE Transactions on Electron Devices · 1998 · 22 citations

Engineering, Electrical Engineering, Materials Science +17

Method for the determination of bulk and interface density of states in thin-film transistors

O.K.B. Lui, Simon Wing-Bun Tam, P. Migliorato et al. · Journal of Applied Physics · 2001 · 21 citations

Engineering, Electrical Engineering, Materials Science +17

Observation of "capacitance overshoot" in the transient current measurement of polysilicon TFT's

Simon Wing-Bun Tam, P. Migliorato, O.K.B. Lui et al. · IEEE Transactions on Electron Devices · 1999 · 19 citations

Engineering, Electrical Engineering, Circuit Theory +16