A.P. Botha

Co2Si, CrSi2, ZrSi2 and TiSi2 formation studied by a radioactive 31Si marker technique

A.P. Botha, R. Pretoriüs · Thin Solid Films · 1982 · 57 citations

Natural Sciences, Chemistry, Materials Science +5

Investigation of ring structures for metal-semiconductor contact resistance determination

A. J. Willis, A.P. Botha · Thin Solid Films · 1987 · 36 citations

Engineering, Materials Engineering, Materials Science +12

Silicon self-diffusion in thin SiO2 and PtSi films

R. Pretoriüs, A.P. Botha, J.C. Lombaard · Thin Solid Films · 1981 · 27 citations

Engineering, Materials Engineering, Materials Science +15

Determination of the diffusing species and mechanism of diffusion during CrSi2 formation, using 31Si as a marker

A.P. Botha, R. Pretoriüs, S. Kritzinger · Applied Physics Letters · 1982 · 25 citations

Natural Sciences, Chemistry, Materials Science +15

Determination of the Diffusing Species and Diffusion Mechanism during CoSi , NiSi , and PtSi Formation by Using Radioactive Silicon as a Tracer

R. Pretoriüs, M. A. E. Wandt, J. E. McLeod et al. · Journal of The Electrochemical Society · 1989 · 18 citations

Natural Sciences, Materials Science, Physics +14