Concepedia

S. Pahlke

SP

Statistics

Publications

24

Citations

683

H-Index

19

Active since

1979

Affiliations

Universities Austria(Current)

Physikalisch-Technische Bundesanstalt

Stanford Synchrotron Radiation Lightsource

Wacker (United States)

Wacker Group (Germany)

S. Pahlke is an author at Universities Austria specializing in natural sciences, materials science, and total reflection x-ray fluorescence.

Publications per year

1979–2003

24

Publications

24

Wet mineralization of organic matrices in glassy carbon vessels in a pressure-bomb system for trace element analysis

L. Kotz, G. Henze, G. Kaiser et al. · Talanta · 1979 · 74 citations

, , +7

Determination of ultra trace contaminants on silicon wafer surfaces using total-reflection X-ray fluorescence TXRF ‘state-of-the-art’

S. Pahlke, L. Fabry, L. Kotz et al. · Spectrochimica Acta Part B Atomic Spectroscopy · 2001 · 67 citations

, , +12

Analysis of Ni on Si-wafer surfaces using synchrotron radiation excited total reflection X-ray fluorescence analysis

P. Wobrauschek, R. Görgl, Peter Kregsamer et al. · Spectrochimica Acta Part B Atomic Spectroscopy · 1997 · 46 citations

, , +16

Low Z total reflection X-ray fluorescence analysis — challenges and answers

Christina Streli, Peter Kregsamer, P. Wobrauschek et al. · Spectrochimica Acta Part B Atomic Spectroscopy · 1999 · 40 citations

, , +10

Total reflection X-ray fluorescence analysis of light elements with synchrotron radiation and special X-ray tubes

Christina Streli, P. Wobrauschek, V. Bauer et al. · Spectrochimica Acta Part B Atomic Spectroscopy · 1997 · 34 citations

, , +16

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