R. Görgl

The Structure of Metallomicelles

Peter C. Griffiths, Ian A. Fallis, David J. Willock et al. · Chemistry - A European Journal · 2004 · 56 citations

Analysis of Ni on Si-wafer surfaces using synchrotron radiation excited total reflection X-ray fluorescence analysis

P. Wobrauschek, R. Görgl, Peter Kregsamer et al. · Spectrochimica Acta Part B Atomic Spectroscopy · 1997 · 46 citations

Surface Characterization, Engineering, Physics +9

Precipitation processes in a Mg–Zn–Sn alloy studied by TEM and SAXS

Boryana Rashkova, W. Prantl, R. Görgl et al. · Materials Science and Engineering A · 2008 · 43 citations

Materials Engineering, Materials Science, Engineering +5

Total reflection X-ray fluorescence analysis of light elements with synchrotron radiation and special X-ray tubes

Christina Streli, P. Wobrauschek, V. Bauer et al. · Spectrochimica Acta Part B Atomic Spectroscopy · 1997 · 34 citations

Light Elements, X-ray Spectroscopy, Special X-ray Tubes +12

Total Reflection X-Ray Fluorescence Analysis Excited by Synchrotron Radiation (SR-TXRF): Variation of Excitation Conditions and Sample Geometries

R. Görgl, P. Wobrauschek, Peter Kregsamer et al. · X-Ray Spectrometry · 1997 · 27 citations

X-ray Spectroscopy, Engineering, Excitation Conditions +22