A. Sarafianos

Building the electrical model of the pulsed photoelectric laser stimulation of an NMOS transistor in 90nm technology

A. Sarafianos, Olivier Gagliano, V. Serradeil et al. · 2013 · 31 citations · Full text

Engineering, Electrical Engineering, Microelectronics +15

Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS

Jean-Max Dutertre, Rodrigo Possamai Bastos, Olivier Potin et al. · Microelectronics Reliability · 2014 · 28 citations · Full text

Engineering, Electrical Engineering, Physics +15

Electrical modeling of the photoelectric effect induced by a pulsed laser applied to an SRAM cell

A. Sarafianos, Cyril Roscian, Jean-Max Dutertre et al. · Microelectronics Reliability · 2013 · 16 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +14

Laser-induced fault effects in security-dedicated circuits

R. Leveugle, Paolo Maistri, P. Vanhauwaert et al. · 2014 · 13 citations

Engineering, Computer Engineering, Electrical Engineering +16