Ting-Pu Tai

Faster defect localization in nanometer technology based on defective cell diagnosis

Manish Sharma, Wu-Tung Cheng, Ting-Pu Tai et al. · 2007 · 39 citations

Engineering, Computer Engineering, Biomems +15

Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data

Manish Sharma, Brady Benware, Ling Lei et al. · 2008 · 36 citations

Engineering, Manufacturing Engineering, Feature Engineering +13

Scan Chain Diagnosis by Adaptive Signal Profiling with Manufacturing ATPG Patterns

Yu Huang, Wu-Tung Cheng, Ruifeng Guo et al. · 2009 · 34 citations

Engineering, Computer Engineering, Manufacturing Engineering +15

Experiences with Layout-Aware Diagnosis—A Case Study

Yi-Jung Chang, Man-Ting Pang, Albert Man et al. · EDFA Technical Articles · 2010 · 20 citations

Engineering, Computer Engineering, Design Automation +16

Diagnosis and Layout Aware (DLA) Scan Chain Stitching

Jing Ye, Yu Huang, Yu Hu et al. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2014 · 16 citations

Engineering, Computer Engineering, Fault Tolerance +14