Heng‐Sheng Huang

Interface characterization and current conduction in HfO2-gated MOS capacitors

Heying Chen, Fu‐Chien Chiu, C.H. Liu et al. · Applied Surface Science · 2008 · 34 citations

Engineering, Electrical Engineering, Materials Science +16

Interfacial and Electrical Characterization in Metal–Oxide–Semiconductor Field-Effect Transistors with CeO₂ Gate Dielectric

Fu‐Chien Chiu, Shuang‐Yuan Chen, Chun-Heng Chen et al. · Japanese Journal of Applied Physics · 2009 · 20 citations

Engineering, Electrical Engineering, Materials Science +17

Electrical characterization and carrier transportation in Hf-silicate dielectrics using ALD gate stacks for 90nm node MOSFETs

H.W. Chen, S.Y. Chen, Kent Chen et al. · Applied Surface Science · 2008 · 14 citations

Engineering, Electrical Engineering, Materials Science +16

Interface trap generation and recovery mechanisms during and after positive bias stress in metal-oxide-semiconductor structures

Piyas Samanta, Heng‐Sheng Huang, Shuang‐Yuan Chen et al. · Applied Physics Letters · 2012 · 13 citations

Engineering, Electrical Engineering, Materials Science +17

I-V model of nano nMOSFETs incorporating drift and diffusion current

Heng‐Sheng Huang, Wei-Lun Wang, Mu‐Chun Wang et al. · Vacuum · 2018 · 10 citations

Engineering, Computer Engineering, Electrical Engineering +14